Researches On Low-frequency Noise Characterization Technology Of Reliability Of NTC-type Infrared Detector

The rapid development of modern science and technology has established a good foundation for a broad application of infrared detectors, high-performance infrared detector is after another. At home and abroad Negative temperature coefficient (NTC) type thermistor Earth satellite attitude control systems is one of the main types of infrared detectors, Is also the core of the system components, its performance has major impact for the satellite attitude control system. Because of confidentiality and national strategies for technical requirements, the implementation of foreign for that type of device are technological blockade, Internal self-development of such infrared detectors although the actual star of systems has been widely used, but the low-frequency noise and other key parameters of the Earth is still sensitive signal detection limit for receiving, thereby affecting system sensitivity and reliability of the key factors. Therefore, NTC-type infrared detector on the low-frequency noise in-depth study to establish the reliability of infrared detector low-frequency noise characterization method has great practical significance.Firstly, this paper is based on the principle of infrared detectors, and the in-depth analysis of various failure modes of the NTC-based infrared detectors is done. The experimental results show that the increasing of low-frequency noise and the voltage peak - peak random is the main failure mode. Secondly, low-frequency noise circuit is built, and noise collection and analysis software system is modified. A typical noise test results of infrared detector (including background noise thermal noise, the main piece noise, the noise patches and the total noise), show that the system can accurately measure the low-frequency noise of NTC-type infrared detector, and analyze and their characteristic parameters. Thirdly, based on the theoretical study and test system, high and low temperature aging test of infrared detectors and the repeated comparison of results is completed. AC parameters (voltage peak - peak) and low-frequency noise parameters (Thermal noise amplitude, 1/f noise amplitude, corner frequency, power spectral density, broadband thermal noise,broadband total noise and noise figure), before and after aging, indicate that with the increasing of the number of aging cycle, 1 / f noise amplitude and corner frequency significantly increase. Fourthly, deep study of the electrical properties of infrared detectors and its physical mechanism is done, and the quantitative model of regular electrical parameters is built. A detailed study of the infrared detector types and production of low-frequency noise mechanism is to build a variety of low-frequency noise physical model; Based on the above experimental results and theoretical research, the establishment of infrared detector electrical parameters and noise parameters associated with models, built its reliability characterization of low-frequency noise-sensitive parameters, then given the reliability of the low-frequency noise characterization method.The completion of this work laid a good foundation for the further research and application. In fact, the low-frequency noise reliability characterization of infrared detectors, still needs in-depth improvement to gain the better effect.