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The Study Of Data Acquisition And Storage System Based On The Serial Flash Memory

Posted on:2011-03-26Degree:MasterType:Thesis
Country:ChinaCandidate:L J WuFull Text:PDF
GTID:2178360308981403Subject:Measuring and Testing Technology and Instruments
Abstract/Summary:PDF Full Text Request
This paper has developed micro-memory test system based on serial flash in connection with high-impact acceleration storage test under small compact environment. This paper has made some study from the following three areas:(1) analyze these key techniques including miniaturization, high impact resistance, high precision, the effective conservation of the signal induced by the harsh environment and so on in the design and take measures to optimize them;(2) describe the programming and modular design of hardware circuit for detail in the hardware design of storage test system;(3) design sub-module of the core controller CPLD according its function and simulate the timing.This paper has analyzed deepgoing theoretically the fastest time of writing data into the Serial Flash SST25VF032B,combining with the actual circuit debugging we come to the conclusion: the maximum acquisition rate of this system is 180 kHz when two-chip serial flash storing data alternately, writing a word for one flash of time should be greater than 11.12μs. The system level for the duration of the high-impact ms acceleration signal can achieve collection storage very well. The sampling frequency can be enhanced by using multi-chip flash to store data alternately.
Keywords/Search Tags:storage testing, serial flash, A/D, CPLD
PDF Full Text Request
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