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Theoretical And Numerical Study Of Light Negative Refraction In Noble Metal Film

Posted on:2016-01-08Degree:MasterType:Thesis
Country:ChinaCandidate:Y ZangFull Text:PDF
GTID:2180330473465396Subject:Physical Electronics
Abstract/Summary:PDF Full Text Request
In this paper, base on the generalized formulas of reflection and refraction developed recently, numerically investigate the properties of transmitted lights traveling through Ag/TiO2/Ag multilayered structures, obtained the TAPV of the transmitted light distribution and the refractive index curve. Comparing with the numerical results obtained by using either FDTD and EFC method, it is clear that, calculated results of this paper is more close to the experimental one. Furthermore, calculated results of this paper show that: the symmetry of the waveguide modes is not the necessary factors to achieve negative refraction at the the metal/dielectric/metal multilayered structures. This work may be helpful to understand the all-angle negative refraction of metal-dielectric- metal multilayered structures, and be useful to test and develop the generalized formulas of electromagnetic wave reflection and refraction.Meanwhile, consider the case of a beam of visible light travel through a wedge shaped noble metal film. calculated results of this paper is good in agreement with the measured results at the wedge shaped Ag film. However, at the Au wedge shaped film, which is in agreement with the observation qualitatively, but not quantitatively. The distribution of time-averaged poynting vector of the transmitted light traveling through a wedge shaped noble metal film may be affected by width and divergence of the incident light beam, energy losses, and so on. At last, through the light propagation behavior are analyzed at the noble metal wedge shaped films and MDM multilayered structures, predicted that the different structure of noble metal film exists a common physical mechanism.
Keywords/Search Tags:negative refraction, the generalized formulas of reflection and refraction, MDM multilayered structures, noble metal wedge shaped films, TAPV, the refractive index
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