Design An Dual–Ram Driver Of Embedded Electrical Resistance Tomographic Measurement System Based On WINCE And ARM

Electrical resistance tomography is a cutting-edge technology of the modern industrial inspection, with non- invasive, no radiation, on-line measurement and other advantages, has been widely applied in geological exploration, industrial process and environmental monitoring. What I want to do in this thesis is, programming a driver for the model of dual-port RAM and a graphical user interface application for the embedded part. The main arrangements and works of the paper are as follows:1. The dual-port RAM communicating model. This part of the Embedded Measurement System is in charge of communication between ARM7(LPC2378) and ARM9(S3C2440) is the most importance part on data delivery. As the dual-port RAM t chip is not the basic device of the WINCE system, so we have to program driver for it by myself.2. The application on embedded module including controlling part and algorithm part. The main task of this part includes programming graphical user interface and transferring LBP imaging algorithm. We alse need to develop the BSP for the embedded part.