Interface Into The Cr Layer Of Ptmn / Nife Exchange Bias

Exchange coupling between an antiferromagnet and a ferromagner across their common interface,due to its intriguing physics and the key role in giant magnetoresistance effect spintronic devices,has attracted a great deal of attention in recent years.In this dissertation, In this dissertation, the magnetism property on the exchange bias of NiFe/PtMn films with the insertion Cr were systematically investigated.The influence of the insertion Cr at the interface on the exchange bias of NiFe/PtMn were investigated. It was found that the exchange bias field was increased 1.5 times by the insertion at the critical thickness of the PtMn layer which has little more Pt elements. On the other hand, the X-ray diffraction shows that the insertion Cr at the interface of the bilayers aids the fcc to fct transformation, and makes the antiferromagnet (AFM) have the better texture. The present results indicate that the insertion Cr facilities the AFM transformation , reduces the critical thickness of the AFM.