Wave Plate To Delay The Amount Of Automated Measuring Systems

In the field of Polarization optics and crystal optics, phase retarders are important optical components that introduce a phase shift between orthogonal and linearly polarized components of light transmitted through them. Fitted with other polarimetric elements, they can realize modifying of light and controlling of polarization states. In fact, nearly all places that in application of polarization technology couldn't be off the Phase retarder. As a result of its special quality, it's widely applied in domains such as optical communication, light memory, information optics technology, space optics, ocean optics, national defense military, aerospace and so on. The paper- The Study of Automated Measurement System to Wave Plate Phase Retardation, has demonstrated a new wave plate phase retardation automatic measurement system, which can realize precision measurement.Along with the development of optics precision instrument, laser and polarized light technology, the request to the wave plate's precision is increasingly high, and the wave plate's detector set is supposed to have the high survey resolution and high survey reproducibility. Phase retardation is one of the extremely important natures to wave plate, and it has the direct or indirect influences on optics precision instrument quality, the laser polarization condition and the optical communication effect. Wave plate's phase retardation is related to wave plate thickness, stress birefraction, ambient temperature and so on, thus to survey the wave plate's phase retardation precisely is extremely valuable.Refer to some reference literature, we find that in many wave plate measurement techniques, the instrument only is pauses in the laboratory instrument condition. We also find that most of actual surveys are operated by manual operation, and that they also have operation difficult complex, longer test cycle and lower reproducibility, as a result do not suit the batch examination. Therefore, it is necessary to study a new measurement method, and to build a automatic, convenient, quick wave plate precision measuring systems.Basing on past research, the paper has established a new wave plate phase retardation automatic measurement system, used the least squares method to minimize the randomized error, and thus realized the wave plate phase retardation precision measurement. The paper divides five chapters: In the first chapter introduction, the development history and present research situation of phase retardation's measurement are introduced. The content, purpose and significance of this paper are also recited.The second chapter mainly introduces basic theory of wave plate surveys. Firstly the polarization and the polarized light knowledge are introduced, and four mathematics expression methods for the polarized light are described. Then the elementary knowledge of wave plate is introduced in detail, chiefly includes some essential properties of the unit wave plate. Finally Malus law and the polarized light interference are introduced. The third chapter mainly introduces several kinds of typical phase retardation measurement plan, including: Advanced polarized light interference method, four-step phase shifting method, 1/4 wave plate method (Senamont Method), pair of 1/4 wave plate method (Tardy Method). All these plan's principle, error source and characteristic are discussed.The fourth chapter mainly introduces a new design of intelligent measurement system to measure the phase retardation of wave plates, which consists of the Optic-mechanical parts, the electrical circuits and the computer software. The survey principle of the measurement system is introduced and schematic diagram is drew. The paper has given out the rigorous conveyed errors of elements by using Mueller matrix and stokes vector theory, and then given out that the uncertainty in the new method was about±0.70°.In the fifth chapter, the experiment based on the new theory is carried on and the test result analysis is given. Firstly the path of rays of the adjustment method, the choice of various parts, and special operations are described in detail. Then, using the new measurement system, 1/4 wave plates for 632.8nm and 650nm are tested separately, and the test data are listed, after that the corresponding analysis and processing to the data are given. At last, the test result has been discussed in the paper, at the same time the capability of the new system discerning thus two kinds of wave plates has been confirmed by the experiment.The innovation of this paper lies in: according to the existing condition of the laboratory, an automatic measurement system which consists of the Optic-mechanical parts, the electrical circuits and the computer software, is designed; The conveyed errors of elements have been studied, and the reduced system error has been realized by selecting proper elements and operation steps; The randomized error has been minimized by the least squares method in data analysis. The theoretical analysis of error confirmed that the uncertainty of the new method was about±0.70'; The experiment in which 1/4 wave plates for 632.8nm and 650nm are tested separately, has proved the new system's high measuring accuracy and usability.