High Temperature Superconductor Film Microwave Surface Resistance Test

As High Temperature Superconductor (HTS) film is applied more and more widely and its manufacture technology improved continually, it is becoming urgent to measure the microwave surface resistance of HTS film that is one of the most important parameters of HTS film. Sapphire resonator working in TE011+δmode is used in this paper to nondestructively measure the microwave surface resistance of a single piece of HTS thin film at 77K. The microwave surface resistance of HTS film under test can be determined by measuring the change of the unloaded quality factors of the loaded resonator. The HTS film can be tested without injury. On the basis of the former researcher , a sapphire resonator working at 12GHz was improved and fabricated. The coupling of the resonating loop has been analyzed by using HFSS, and it has been improved. The automatic test system is also founded. The system features high sensitivity and good repeatability and can be successful used to measure HTS film. The system errors of the measurement results are analyzed in this paper.