The Application Of Inductively Coupled Plasma Mass Spectrometry In The Analysis Of High Purity Indium Impurity Elements

Inductively coupled plasma mass spectrometry (ICP-MS) is an elemental measurement technology in the 1980s. Nowadays, ICP-MS has become an acknowledged powerful technique for the measurement of trace element and isotope, with a wide spectrum of applications. It has such analytical features as high sensitivity, extremely low limit of detection and wide linear dynamic range, simple lines, few interferences, rapid analysis, and capabilities for multi-element and isotope ratio determination. In this thesis, inductively coupled plasma mass spectrometry was applied for detecting the prescriptive twelve impurity elements in high purity indium, and investigating the detection condition for each element. The research has a beneficial significance for the detection of the impurity elements in high purity indium. The conclusions were indicated as follows:(1) Firstly, instrument parameters, experimental method, detecting pattern and mass number of every element were determined by turning the optimal condition of instrument and character of instrument analysis, and by the quality of high purity indium respectively. The detecting pattern and the selected mass number were intensive to measure the impurity elements of high purity indium by ICP-MS. By comparing of the results, three modes were resolved to detect the impurity elements, which were collision cell technology (CCT) for ⁵⁶Fe, conventional XS^- mode for ⁶³Cu, ⁶⁶Zn, ⁷⁵As, ¹⁰⁷Ag, ¹¹¹Cd, ¹¹⁸Sn, ²⁰⁵Tl, ²⁰⁷Pb and cool plasma mode for ²⁵Mg, ²⁷Al, ⁶⁰Ni.(2) Collision cell technology (CCT) was developed for the determination of ⁵⁶Fe in high purity indium by ICP-MS. The sample was diluted by 2500 times in 0.3mol·L^-1 nitric acid medium. As internal standard element ⁵⁹Co was added into the sample, and on-line standard addition method was applied to detect the sample. The coefficient of recovery, RSD and the limit of detection were ranged from 94.0-102.1 %, 6.67 % and 0.06ng·mL^-1 respectively. The determination result was satisfied.(3) ⁶³Cu, ⁶⁶Zn, ⁷⁵As, ¹⁰⁷Ag, ¹¹¹Cd,¹¹⁸Sn, ²⁰⁵Tl, ²⁰⁷Pb were detected in the conventional XS- mode by ICP-MS. The same as above, the sample was diluted by 2500 times in 0.3mol·L^-1 nitric acid medium, and then ¹⁰³Rh and ²⁰⁹Bi were added into ⁶⁶Zn, ⁷⁵As, ¹⁰⁷Ag, ¹¹¹Cd,¹¹⁸Sn and ²⁰⁵Tl, ²⁰⁷Pb sample, as internal standard element respectively until they were analyzed. On-line standard addition method was used to measure those elements. The coefficient of recovery, RSD and the limit of detection were investigated for all elements, the results were ranged from 94.0-102.0%, 1.33 - 5.26% and 0.05 -0.07ng·mL^-1 respectively. The results indicate that the developed method was accurately, reliability and satisfied.(4) The cool plasma mode of ICP-MS was applied to detect the three impurities of ²⁵Mg, ²⁷Al,⁶⁰Ni element in high purity indium. The elements were measured by On-line standard addition method. In the method, the sample was diluted by 2500 times in 0.3mol·L^-1 nitric acid medium, and ⁴⁵Sc was added to the sample as internal standard element. The coefficient of recovery, RSD and the limit of detection were ranged from 96.0-102.5 %, 3.33-5.83 % and 0.05-0.07 ng·mL^-1 for the elements respectively.In this work, the three methods (Collision cell technology, the conventional XS^- mode and cool plasma mode of ICP-MS) were developed to detect the twelve prescriptive impurity elements in high purity indium. The application of analytical instrument parameter and the methodological condition were investigated. The results illustrate that those technologies can provide a beneficial reference for the determination of the prescriptive impurities of metal elements in high purity metal.