Small Distance Measurement And Realization

The gap of the LCD is the thickness of the LC. In the process of manufacture, improper operation will cause LCD gap asymmetry, and LCD will not achieve the specifically display mode. So it is very important to measure the gap of LCD accurately.Of course, in order to get the thickness of the LCD, the operator must measure the thickness of the IP and ITO film. Actually, the exact thickness measurement of film is very important for the technics control, material analysis and the relationship between implement and material.A new thickness measurement technology of LCD gap and film was introduced in the paper. Being different from the mostly laser sourse, the method used the white light as the light source. The spectrum equipment was used to measure the reflected spectrum, reflected rato etc. By anglicizing the relationship between wavelength and the reflective light intense; the operator can obtain LCD gap, film thickness and the refractive index of the film. Being different from other methods, it can measure the thickness of the sigle dot quickly and expediently.When the incident angle is not 0, and the refractive index of the film is unknown, the operator must get the reflective spectrum. However, the current equipment can only measure the reflective spectrum when the incident angle is 0.The hardware of the spectrum equipment was disigned, which laied a solid foundation of the film measurement. The focus of this system was to design the hardware of linear-CCD data sampling system based on ARM processor, and the related software to support the system. The system was composed of three modules. In order to produce CCD driving pulses, the CCD driver module was used to program the ARM. After preprocessing, the output signals were transmitted into ADC module, in which they were converted into digital signals. And then they were processed in ARM processing module. Finally, the debug process and the compiled system were demonstrated.