Single Event Effects Circuit Simulation Method

Single Event Effect (SEE) is one of the main research areas of integrated circuit design in aerospace field, which is of great significance in the study of the reliability for aerospace electronic device. With the development of microelectronics and the reduced feature sizes for semiconductor, single event effect has been becoming an increasing concern in aerospace equipment. Several SEE simulating methods have been proposed to evaluate the SEE impact to circuit, the efficiency of which directly determined the speed and quality of circuit design.Based on the researching on SEE theory, this paper modeled the single-event transient (SET) pulse and its propagation in the circuit. At first, a pulse injection model which based on Weibull function was presented. This model directly uses parameters to depict the characteristics of SET pulse. And then, based on the analyzing of three masking mechanisms, we presented a single gate based SER analysis method for combinational logic circuits. The proposed algorithm is based on the calculating of some basic gates'SER value, which simplified the process of SEE modeling and SET propagation. Simulation result shows that the SET pulse generated by the parameterized model based on Weibull function has a good match with that of empirical model. And the proposed gate based SER analysis method, compared to other algorithm, can basically keep the simulation results in the same order but with lower simulating complexity.Because our modeling and simulating for SEE are under several assumptions, the accuracy and applicability of the algorithm are still need to be improved. But the proposed algorithm provides a new research approach to modeling and simulating for single event effects, which has strong theoretical reference value. And also the conclusion of the paper has some practical significance to the application and development of domestic aerospace technology.