Design, Analog Integrated Circuit Test System Based On A Single Measurement Point

As the difficulty of the circuit testing, analog integrated circuits testing are further researched by many experts and scholars of the world. Compared with digital circuits testing, analog circuits testing is harder to achieve in both theoretical method and engineering practice. Analog circuit testing is mainly divided into two parts: one is the fault diagnosis, the other is fault location. Fault diagnosis means use some methods to determine whether circuit fault occurs. That is achieved easier. Fault location means to find out what the fault type is and where it is. At present, the fault location is more difficult to be solved.In this paper, we researched in the method of the fault diagnosis based on one testing node. Since there is less circuit's information, the method of only one testing node is much more difficult than the way of multi-testing node. Although the technique of one testing node is hard to solve, it has realistic significance. We absorb the advantage of the dictionary method and the wavelet transform, and used the theory of subband filtering to pick up the characteristic of the signal.Firstly, we introduced the background and the principle of the analog circuit testing. Secondly, the testing algorithm was given. Then we introduced the structure of the hardware platform, and the design of the software of the system. Finally, we used the test system of the analog circuit to test the actual circuit, and obtained the test results. In this project, we established a set of analog circuit hardware platform, and finished the test software using the LabVIEW tools. We achieved the test algorithm by the Matlab software. The test algorithm was verified correct through the simulation test.