Development Of Real-Time Electronic Detection System For Raw Silk Based On CRIO

Chinese raw silk occupies the monopolistic resources advantage in international market as the important export commodities, for a long time, blackboard manual eye inspection is still being used for the detection of evenness and defects for raw silk. But in a certain extent, this method of inspection was affected by inspection personnel's subjective influence, so the subjectivity of test results is strong and the reproducibility is poorer. With the progressing technology, increasingly rise of production technology and equipment level, the implementation of electronic inspection for raw silk is imminent.The electronic inspecting methods for defects of raw silk are discussed in the paper. As for hardware, improved SD-1 (sampling rate for 10k S/S) dynamic size tester for raw silk is connected with NI CompactRIO, based on theμs level time control characteristics of FPGA module built-in NI cRIO platform and 9014 real-time control system; NI LabVIEW software development platform, NI FPGA and Real Time module to develop software systems, the development of software system is emphatically introduced in this paper. In order to support the system, a series of experiments have been made, including the feasibility, stability and accuracy, and the sampling on the different levels of silk, analyze the correspondence between the experimental data and bales of silk. The results show that the system can realize rapid, accurate, spindle, much ingot, on-line detection and analysis for the raw silk. The popularization and application of the system will improve the efficiency for the detection of raw silk, and it also has a positive meaning for the development of the electronic detection.