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Research On The Pressure And Temperature Dual-channel Oil Down-hole Test System

Posted on:2013-12-18Degree:MasterType:Thesis
Country:ChinaCandidate:L WangFull Text:PDF
GTID:2231330371968347Subject:Measuring and Testing Technology and Instruments
Abstract/Summary:PDF Full Text Request
During the well development process, pressure and temperature date are key parametersin the field, and is essential to the well development process. So the research of down-holetemperature and pressure test system is very necessary.Based on the importance of pressure and temperature parameters in well test, this subjectdeveloped pressure temperature dual-parameters oil down-hole test system, to meet thehigh-capacity date storage, non-volatile date, micro-power and small-volume, intelligentoperation, collected several times in one time to go down, servo trigger to avoid falsetriggering and sensor temperature compensation in down-hole test, and the test results wereanalyzed to verify the accuracy of the test system. This paper introduces the researchbackground first, then the overall design of the system proposed, and the key problems of testsystem such as sampling strategy, servo trigger technology and temperature compensation areanalyzed in detail and gives solutions, next, focus on the test system hardware design,software design and mechanical shell design, Finally, the analysis of measured data to verifythe accuracy of the test system, and we have proposed to the influence factors of compoundperforating technology, and give the key solutions to improve the productivity of the well.This article focuses on the key technologies includes: we use high-capacity non-volatilechip to improve storage capacity and data retention time, digital trigger is used contrast to theprevious technical, this new servo trigger technology achieved without programmingautomatically trigger. The system control module designed a dual system based on CPLD andmicrocontroller test system, make of the respective advantages of CPLD and MCU tofunction effectively, and simplifies system design.
Keywords/Search Tags:Pressure and temperature test system, High-capacity and non-volatile memory, Temperature compensation, CPLD, MCU
PDF Full Text Request
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