Reliability Study Of Wired Headset Connector

Connector is an important part of telecommunications equipment and it provides a guarantee for high-efficiency output of signal. Wired headset is used in mobile phones, MP3players and other audio equipments as a portable electronic product. The signal is transported through the plug and receptacle mating contact. The electrical connection of wired headset affects the quality of the entire system reliability and its poor contact will cause malfunction of the system. There are many factors affecting the reliability of the connector, such as the mechanical structure of the electrical connector, surface coating materials, the position of the electrical contacts in the whole system, environmental pollution, the usage.The main content of the subject is to do research on the reliability of several kinds of wired headset connector. The connectors are different in coating materials(Ni/AuN Ni/PdNiN Ni/Ni). Based on the survey of the research literature, electrical properties, mechanical properties, and environmental adaptability research have been done to the connectors. According to the content and features of the subject, effective research method is developed. On the basis of the four-point method, the way to eliminate the electromotive force can be drawn. In order to meet the test requirements of mechanical properties, a connector life detection system and insertion force detection system is designed. According to the actual environmental conditions and criteria of environmental testing, the research methods of environmental adaptability can be drawn. The reliability of three kinds of headset can be shown after the cycle test, insertion force and removal force test and damp heat test. Then, the main factors affecting the headset performance can be drawn. The connector can be optimized from the point of improving the performance of coating material.After the research, the mechanical property of the headset connector is stable because the insertion forces and removal forces of all headsets are qualified. After the cycle test, the contact resistances are qualified. But after the damp heat test, most of the contact resistances are failed. The reliability of Ni/Au connector is the best one in the three kinds of connector. And the Ni/Ni connector is the worst one.According to the study, the environmental adaptability of headset is poor and the damp heat test is the main factor affecting the headset performance. According to the research, an optimization scheme is proposed that headset is optimized with the Ni/PdNi+Au plating. Then, the effectiveness of the optimization program is assessed. The reliability of wired headphone connector can be drawn through the study and can provide some basis for headset connector coating materials research in the future. The coating material of headset can be determined according to the climatic characteristics of the headsets use location. The study is a combination of basic theory, experimental research and practical applications.