Research On Electromagnetic Damaging Mechanisms And Threshold Values Of Electrical Equipments On Vehicle

In recent years, with the electronic and automation rising, electromagnetic interferenceand damage become one of the major hidden dangers of the cehicle causing byelectromagnetic pulse in complexity electromagnetic environment. Electromagnetic pulsecan couse the reversal of electronics’ state, the performance reduce of power amplifierand actuators mistakes, and it even can cause the car doesn’t work by producing damage.Therefore, the study on vehicle electronics damage mechanism can provide theory anddata support to vehicles protection technology.In order to explain the vehicle electronics damaging mechanisms and threshold valuescaused by the electromagnetic pulse, this article has researched the conductive couplinglaws between the parallel wires in vehicle wiring harness, designed and built the testplatform of electromagnetic pulse damaging threshold values, researched the distributionlaws of damaging threshold values, tested BJTs, CMOSs and TTLs’ electromagneticpulse damaging threshold values, and the test methods of vehicle electronicselectromagnetic pulse interference and damage threshold values.In the coupling of the wiring harness, according to the stand of ISO7637-3, this articlehas tested76points in the frequency range between0-200MHz. The basic laws ofconduction coupling problems in wiring harness has been analyzed through the couplingefficiency test for parallel wires. The tests content0cm and1cm between wires couplingefficiency test2cm,5cm,10cm between wires and reference ground coupling efficiency.In the electromagnetic pulse damage threshold values of vehicle sensitive electronicequipments, according to the semiconductors test methods stand of GJB538-88thispaper design and build the test platform by using an oscilloscope as the measuringequipment and using EFT as interference sources.150test datas are given by theelectromagnetic damage threshold values test of400BJTs, N-CMOSs and TTLs.Through the test datas, range of damage threshold and electromagnetic, energy andpower relations are given. It also have benefits for vehicle sensitive electronics andprotective strength chosing.In the electromagnetic pulse damage thresholds of subsystem, according to the test methods stand of ISO11451, a subsystem electromagnetic pulse damage thresholdplatform has been set up. The damage thresholds of electronic throttle, speed sensor andso on are given by using the test platform.The main work listed distribution follows:Firstly, this paper preliminary define damage level to providing the basis for electricequipment damage threshold of efinition. Through the electromagnetic pulses damagethreshold testing of CMOS, TTL and BJT, the damage threshold laws, test distributions,electromagnetics have benefits for the systematic test methods.Secondly, the paper designs and builds the electromagnetic pulse interference anddamage testing platform for semiconductors and vehicle subsystem. This paper verifiesthe feasibility and correctness of the test method of test platform by the testing of typicaldevices and subsystems.At last, according to the stand of vehicle test methods for electromagnetic interferenceand damage, this paper has carried on beneficial exploration and gets systematic testingmethods to vehicle electronics’ interference and damage caused by electromagnetic pulse.The test methods based on setting up test platform and testing data, and contain themethod of test setting up, calibration and electromagnetic pulse loading.The above works provide basic datas support to the research of electromagneticsensitivity. The works also can provide test methods for electromagnetic sensitivitytesting, and have some reference values for the research about electronic equipments’protection and electromagnetic damage.