The Study On Process Capability Index And Control State Evaluation

The evaluation of process capability and statistical process control technology have been promoted and applied rapidly in the military electronic component manufacturing of china.in order to adapt to the producing characteristic, which are complicated technology and various sort and small lot; many special algorithms are developed and applied. These special algorithms aim to particular technology characteristic, ensuring the precise evaluation and situation control on the process capability of this kind of process. Avoided the wrong alerting and omitting alerting, improved the products’ percent of pass, having incomparable superiority of accuracy comparing to that of the conventional algorithmBased on the deep analysis of distributing characteristic to chip adhesion special process data, according to the characteristic of chip adhesion no-normal distribution and process capability evaluation mostly are normality condition, the thesis put forward process capability index algorithm prototype of chip adhesion process,and completed analog data verification, this system prototype was tired in the lanacaspc software of Beijing xinjiataike technology co.,ltd,and realized chip adhesion process capability evaluation and controlled situation evaluation, achieved the expected effect. Meanwhile, the thesis analyzed affect of measure instruments standard deviation to the process evaluation during the course of SPC (statistical process control) implementing, and given the method to evaluate measure instrument with control chart technology.