The Study Of Key Technologies In High-speed Data Acquisition And Storage Device

In this paper, some key technologies is mainly discussed and researched in the processof design of High-speed Data Acquisition and Storage Device. The High-speed DataAcquisition and Storage Device belongs to the class of comprehensive electronicequipment, which contain interface circuit and logic protocol and mechanical structures. So,the High-speed Data Acquisition and Storage Device also mainly discuss and design thethree aspect.According to the applications and requirements in the actual environment, this paperformulate the plans of design. Meanwhile, This paper analyze and design the reliability of422and LVDS signal communication. The reliability of interface circuit design contain theboth of hardware circuit design and logic protocols design. In the aspect of hardware circuitdesign, this paper analyze some factors which may take the detrimental effect to reliabilityof422and LVDS transmission link，and make the measures to solve this problem, andfinally design the signal transmission circuit. In the aspect of logic，in order to eliminate thenegative effects which from the source of the disturbance, this paper design the eliminatingjitter signal program, the reliable transmission of LVDS data, the handshake protocol ofreceiving422command signal and the machinery of return status from the device. At thesame time, In order to improve the protection technology, we discuss and analyze the bufferprinciple and protective structure of test equipment, and use the ANSYS-AUTODYN tosimulate the protection technology of test equipment in the high overload environment.In the last，this paper provided the test platform and test environment for theHigh-speed data acquisition and storage device, and verified the performance of high-speedacquisition and storage device by actual test data. In a variety of environmental testing,High-speed acquisition and storage devices have no errors and show good reliability.