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The Research Of VLSI Aging Prediction And Anti-aging Technology

Posted on:2014-09-15Degree:MasterType:Thesis
Country:ChinaCandidate:C WangFull Text:PDF
GTID:2268330401488841Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
With the development of integrated circuit technology, integrated circuitperformance continues to improve. However, integrated circuit improvement inperformance also brought new threat to its reliability. After Integrated Circuitindustry technology marching into nanoscale geometries, circuit aging caused bynegative bias temperature instability (NBTI) is one of the main challenges of VLSIreliability. NBIT will cause delay failure of timing path and timing failure as afurther result, circuit fails finally. The failure caused by aging is intolerant in somesystems that require high reliability such as aeronautics and astronautics. Theresearch on VLSI aging is desirable and this paper focuses on discussion of twopoints of VLSI aging issue.Thesis first expounded analyzes the feature and shortage of existing onlineaging failure prediction structure, a high speed aging sensor for circuit failureprediction is proposed based on online delay sensor. This aging prediction structureuses new stability checker (SC) and gets rid of “ultra sharp” of output signal andproblem caused by ignoring dynamic node discharging time via modification of SCtiming, which is helpful in high speed IC chip. Besides, the self-lock structuresaves hardness cost and simulation result demonstrates the feasibility of thisdesign.The signal-violation failure detector can use a unified fault detection teststructure for the multiple objective fault detection at the same time. A high-speedsignal-violation detector (HSVD) based on stability violation(SV) is proposed. Thisstructure expands the field of the existing online time delay issue detection with acapability of simultaneous detecting signal violations such soft error, delay faultand aging prediction. Compared with existing detection structures, one of the mostadvantages of the proposed structure is that it uses the C unit as the stabilityviolation detector output and makes it more suitable to high speed IC chip. Finallythe simulation results of HSVD show that these improvements are effective.
Keywords/Search Tags:Reliability, circuit aging, negative bias temperature instability, agingperception, failure prediction
PDF Full Text Request
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