Research Of A System Integrated Rotational Speed And Temperature Measurement Based On MCU

For a long time, rotational speed and temperature, which can directly reflect the working condition of machines, are two essential parameters in measurement and control field. As the development of large scale integrated circuit and microelectronic products like MCU, the method of contact measurement has been eliminated, for it’s too inaccuracy to meet the test standard of new-age devices.Though infrared tachometer and infrared thermometer are commonly used nowadays, integrated instrument for the two parameters is rare. Therefore, this paper is of practical high value, it’s a research on a system integrated rotational speed and temperature measurement based on MCU.This paper has thorough in-depth analysis on the current speed and temperature measurement method, aiming at the deviation in the process of measurement and combing with the measurement method to improve, a kind of system controlled by MCU AT89C51had been figured out. It is used in large spindle speed and non-contact temperature measuring system. On the speed measurement, using infrared electric sensor, when receiving tube of the photosensitive surface receives the reflected infrared light into a weak voltage pulse signal, and then, after a two stage reverse amplifier and two shaping processing, combined with the two16bit time/counters in the MCU, finally calculated the rotational speed by MCU and the LCD1602display shows the numerical value. On the temperature measurement, using the theory of Stephen Boltzmann’s law and choosing type TN9infrared temperature measurement module, MCU was used to read the temperature numerical value in temperature measurement module, the final result will be shown on LCD1602displayer.Results indicate that the system is efficient and qualified in real-time test. This very portable device features high accuracy, wide measuring range and quick response.