The Research Of Photoelectric Characteristics Of Liquid Crystal Electric Control Wave Plate And Its Applications

The application of liquid crystal technology in the technical field of optical information has become more widely, The electro-optical and magneto-optical properties of the liquid crystal materials has been used to prepare various types of electrically controlled liquid crystal device, they are characterized in that the driving voltage is low, easily controlled, can be integrated, miniaturized, arrayed, the speed regulation is fast, no mechanical motion, and it is easy to be integrated with other photonic devices. Two dimensional distribution of the optical path is formed due to the tensor properties of continuous elastic body of liquid crystal, and the device’s potential or thickness distribution, so as to realize the beam deflection and beam shaping. However, There is a strong nonlinear relationship between the voltage and electrically controlled birefringence on the liquid crystal cell. The distribution of potential can’t be mutated in the liquid crystal layer, too. The distribution of the liquid crystal director field vector is also not continuous. For these reasons, the distribution of two dimensional optical liquid crystal devices is difficult to be quantitatively when are used. With the deepening of research and application of liquid crystal optoelectronic devices that they have a micro pixel structure, the optical path difference distribution or phase delay distribution is the key technical parameters of those devices. Because of that,The Research of testing method of the OPD’ one and two dimensional distribution of liquid crystal optoelectronic devices provides a new tools for the study of liquid crystal optoelectronic devices,which has a very important significance.In this paper, the main research work:1.Based on the Oseen-Fank and Electrically Controled Birefringence(ECB),a simulation model of OPD’ 2-D distribution of liquid crystal deviceis set up.Different micro-structure of liquid crystal devices’ OPD’ distribution is simulated by writing MTALAB program,and The OPD’distribution of liquid crystal devices are analyzed,too.2.Compared with the Senamont method, Thesis presents a compensation method that the liquid crystal electric control plate is used as a compensator. It can be used to measure the distribution of the optical path difference,This method can be called liquid crystal wave plate Compensation Act(LCCA).Through theoretical analysis and test methods research,the micro optical path difference testing system of the Senamont method and the LCCA are designed.3.The electrically controlled liquid crystal wave plate’optical path difference— voltage characteristics were determined using the the Senamont method in different light source and electric field.The measurement, calibration and validation of one dimensional of liquid crystal electric wave plate’ OPD is completed by the LCCA with high test precision.Test results are compared,Knowing how to choose the best compensation range and driven field of liquid crystal electric wave plate for testing.When using LCCA, the test system select light source,there are more choices.4.The two dimensional distribution of OA-SLM and Liquid crystal light deflector ’OPD is tested by the micro optical path difference testing system under different light source.The test characteristics of the Senamont method and LCCA are compared.The 2D distribution trends and law of OPD are analyzed,When the thickness of micro structure change.The experimental results are in accord with the simulation results.That is,the two-dimensional distribution of OPD depend on the liquid crystal device’thickness distribution.The simulation model and LCCA’ test system proved to be effective in the papers.