Study On The Interface Stress Of Nano Defect Under Anti-plane Loading

With the development of nano technology, nano composite material has been widely used in engineering practice. Consistent efforts into the nano materials make the material research gradually from a macro level into the microscopic level. But when the size of materials is in nano meter scale, material mechanics performance is affected by scale effect obviously, which need to take inclusions and the effect of size between phases. So on the basis of the classic mechanics of elasticity, considering the surface/interface effect on the mechanical properties nanometer materials research has become a new branch of composite materials, which provides a rare opportunity to breakthrough in the development of composite materials.A theoretical study on the orthotropic materials containing a nano defect under far-field anti-plane shear load is reported. By applying the theory of Gurtin-Murdoch surface/interface model and the conformal mapping technique, a rigorous analytical solution of the stress fields is presented. Several special cases are obtained based on the present solution.Nano materials with elliptical inclusion and a square hole is respectively studied. when the defect is elliptical inclusion, to change the size of the ellipse, could discern some special cases of the closed solution of stress field, and analyzes the size of the elliptical hole, the ratio of the elastic main direction, elliptical shape ratio and shear modulus of matrix effects on stress field; When the defects is a square hole, the first study of the material is isotropic anti-plane problems, and on this basis, draw materials for orthotropic closed solution of stress field, discussed the square hole the size of the elastic principal direction, than the effect on the stress field, respectively.