Research On The Acoustic Emission Source Location Method Of Rock Materials

Rock is a fragile material in the nature, and there are many kinds of defects withinthe rock. Through an external power, the inside construction of rock has changed, andnew crack defects has happened. The process generates a lot of acoustic emission (AE)signals. The rock failure process can reflect the process of damage evolution. Acousticemission activities and attributes are directly related to the rock. The rock internal microcracks inoculation, initiation and propagation are well reflected in the process. Therefore,to do the research of source signal can make a safety warning. The result provides a workbasis for the rock materials.Multiple sensors were arranged on the surface of rock to obtain acoustic emissionsignal. Then get the time delay in order to realize the damage location. First of all,acoustic emission instrument was used to get the acoustic emission signal; then wavetranslate was used to deal with the noise. The way of all phase spectrum was used toanalyze the denoising signal; Finally, minimum two multiplication was used to get thelocation of the emission source. The instrument location result and the calculate result arecompared. Through comparing the location error, it is concluded that all phase spectrumanalysis in the field of acoustic emission source localization can get a certain feasibility.All phase spectrum analysis was used to rock, since the acoustic and acousticemission has certain similarities: different propagation paths will produce differentwaveforms, such as longitudinal wave and transverse wave; The signal is feeble, and itgenerally cannot be heard; They are not stable; There are all kinds of inevitableinterference in the propagation process. Acoustic emission signals have a lot in commonwith sound wave, so the sound wave theory can be used to the acoustic emission signal.As the AE signals will produce energy decrement during the process of spreading,the phenomena will lead to the position error of closer sensor smaller than the positionerror of further sensor.