Design On Accelerated Testing Device For Electromagnetic Relay’s Storage Lifetime

Electromagnetic relay is a kind of mechanical switch that it can connect, load andbreak current of the circuit. At present, Electromagnetic relay is widely used in all kinds ofcontrol system, therefore the problem of the reliability of the relay is more and moreattention, which life and reliability is very important. The life of the relay should not onlyrefers to the life of electrical and mechanical, but also include the storage life. So the studyfor relay storage life is very necessary. General relay’s storage life may be about20or30years or longer. Directly study up will takes a lot of manpower and material resources, sowe need to use shorter time and less cost to study. So to achieve accurately calculate thenormal stress level of the product life by accelerated life test, I adopted a accelerated lifetest method for storage life of electromagnetic relay accelerated test.This paper introduces the device of electromagnetic relay storage life accelerated test.It can measure hundreds of contact parameters under different stress level in as many asdozens of relay at the same time. And developed its software systems by graphicalprogramming tool LabVIEW8.20, only by operating buttons on the interface, it can runrelevant test, automatically save the failure information of the test, and support for printing.The test device has simple operation, functional, and high degree of automation features,high value of application.