| In recent years, the electrical appliance is becoming popularity, and widely used in our daily life. Temperature switch is one of the indispensable parts in Electrical appliances, which act as the thermal protector for electrical appliances. The electrical appliance’s performance is directly influenced by the quality of the switch, poor temperature switch may affect the normal work of electrical appliances, or even lead to significant economic losses. Traditional method to detect the quality of temperature switch is inefficiency, which seriously restricted the temperature switch industry development. This requires that we find a new detection method.This paper has studied the temperature switch’s structure, working principle and the key factors which affecting the quality of temperature switch, analyzed the existing detection technology, and determined test parameters. In addition, the theory of arc time and the FPGA technology is introduced in paper, on the basis, the overall design scheme for the system is given, and the function module for embedded system is divided. Using Verilog language designed muti-channel arc signals acquisition module, multi-channel selector module, temperature acquisition module within the FPGA. A Nios II processor was constructed in FPGA by using SOPC technology, whose main function is replace the traditional microprocessor to control module, responsible for communicate with PC, receives and parses the command from the upper machine, and make corresponding response. The part of software main used C language development on Nios II.Finally, the system is simulated and tested,the results indicate that the multichannel temperature switch detection system design that based on FPGA is feasible. And it also shows that the system capable of simultaneously measuring multiplex arc time, measurement accuracy is 0.01 ms. The design improves the temperature switch testing efficiency, at the same time the system is also easy to upgrade. |
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