| Solar has been widely used by the advantages of inexhaustible, clean, pollution-free and so on, the most successful way of using solar energy is solar photovoltaic. Solar cell is a kind of semiconductor devices that can convert light energy into electrical energy. In high temperature, cell material’s latent defects, impurities and defects generated during the production were activated, which seriously affect the quality and reliability of the cell. For the cell’s failure modes and failure mechanisms at high temperature stress, it’s necessary for us to find an efficient and sensitive characterization method to characterize its reliability.The article summarizes the failure modes and failure mechanisms of solar cells in high temperature stress, sums up basic knowledge of noise and the sources of noise in solar cell. On this basis, a hot accelerated aging test is developed, test and analysis solutions are designed, including the design of the bias circuit, building noise test platform, extracting characterization parameters, designing of the test’s specification and process. In accordance with the test program, electrical parameters and noise parameters of solar cell pretest-posttest are tested respectively, electrical parameters and noise parameter characterization methods are contrasted. Experimental results show that the noise parameters characterizing method can accurately reflect the effective degradation of solar cell performance, what’s more, the noise parameter characterization method has higher sensitivity than electrical parameters characterization method. Further, combined with noise generation mechanism in semiconductor devices and failure mechanism of physics in solar cell, from the transport relations of defects and carriers, the causes of noise amplitude changes are analyzed, and the mechanism of the solar cell performance degradation is explained.This study can provide effective failure characterization and analysis in which the solar cell performance degradation caused in high temperature, provided theoretical support to improve the reliability of solar cells in the further. |