Development Of A New Prototype System For Measuring The Permittivity Of Dielectric Materials

The rapid development of the electronic industry and the communication field inspires the blossom of dielectric materials. People are eager to find a way to measure the properties of the dielectric materials fast and accurately.The main electromagnetic parameters of the microwave materials are permittivity and permeability, electric loss tangent and magnetic loss tangent. Permittivity and electric loss tangent are two main important electric parameters. The researchers have worked out many methods to measure the dielectric materials of different shapes and permittivity.In this thesis, a new prototype for measuring the properties of dielectric materials has been proposed. The method of the measurement system is based on the compensation theorem. The permittivity and the loss of the dielectric sample will be calculated due to the change of the input impedance of the antenna(with and without the sample). At the beginning of the thesis, the methods of measuring the permittivity have been introduced and draw out the significance of the research. And then the method used in this thesis is introduced, it describes in detail of how to measure the permittivity and the loss tangent. After studying the theory of the method, the design scheme of the system will be determined. The system can be separated into three main sections: antenna part with a dielectric sample, a RF module and a data processing module. Firstly, the principle of each part should be learned. Secondly, some software of electromagnetic and other programming will validate the parts in simulation. To ensure the three parts working properly, the measurement and the debugging will be done. Finally, the three parts combine into a system. Before measuring the dielectric properties, the system must be calibrated. Then the system can be used to measure the dielectric samples.After doing the experiments, the results showed that the prototype system can measure the permittivity and loss tangent of dielectric materials. The experiments prove the practicality of the new system.