Design And Implementation Of RFID Automatic Testing System

With the development of the integrated circuit chip companies, the chip testing system based on PC also has a strongly growth, aslo as a hot issues for reseach and development. Quickly and accurately in chip testing fields, already made a significant role in those industrials.For enterprises test requirements, such as efficient and stability fundamental factors. Designed an ATE testing system which included two firm testing moudles,chip testing touched directely and coupling testing with antenna. System included several design parts,hardware PCB design,firware and PC terminal software design.User’s PC software designing, also can be selected firm PCB and software module for optional testing.Depends on individual functional parts for different chip testing requirements. Thus, developed several parts included LF, HF, UHF hardware modules. Based on parallel test multi-chip in single step, the testing hardware PCB lay out as matrix type, up to the requirements. Hardware design support multiple data interface, for instant, GPIB, USB and URAT port for data transmiting.Installation software programmed by C serials language.Upon it, compiled out the firmware for chip on PCB flashing and installation software.Also developed the invoking and debugging API for data transfer to SQL database. Consequently, the API codes are conveninent for portable in other platform and debugging.By actual on spot products testing,we sorting tested125KHz low frency4100serials chip、13.56MHz high frency chip included Ultralight and Mifare one chips, also tested915MHz M4QT in UHF scope。In actual production working test and electrical performance testing, the stability and the accuracy in testing achieved to the desired design requirements. The electronic testing performances up to the international standards.In terms of protocol information write and read testing, can be adapted to customized information. The test results shown, compared to traditional testing systems, short the two steps (functional test step and customized information write step) into one step, save time and efficiently. In the RFID chip testing system field, can be as a reference and an observations for competible testing the common products those are on sales.