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Research And Implementation Of Analog Circuit Automatic Test Program Generation System

Posted on:2016-12-05Degree:MasterType:Thesis
Country:ChinaCandidate:M H XuFull Text:PDF
GTID:2298330467993326Subject:Software engineering
Abstract/Summary:PDF Full Text Request
In recently years, the development of science and technology and information industry, electronic equipment of modern higher for accuracy and complexity requirements of growing, circuit board equipment built-in precision and complexity and rapid promotion, the importance of the analog circuit corresponding function test and fault diagnosis of the link is considered whether a device stability, important standards are good. In the analog circuit function test and fault diagnosis, test program sets (Test Program Set, referred to as TPS) is an important core, decided to test the efficiency and the rate of diagnosis in analog circuit fault and therefore, in the field, performance of a TPS and its corresponding supporting environment will directly determine the performance of the circuit board and electronic equipment. So in the design and development of electronic products, has developed a set of efficient, automated TPS is an important link is particularly important and urgent and improve for the field of analog circuit.Under the VisioStudio2010environment using C++language to design and realize the simulation circuit automatic test program generation system. The system is based on IEEE1232protocol, and realizes the automation of test program sets, with the method according to the function of analog circuit test and fault diagnosis are:through the AI-ESTATE model given by IEEE1232is extended, add model of artificial immune system (Artificial Immune System Model, referred to as AISM), the neural network model (Back Propagation Model, referred to as BPM), support vector machine model (Support Vector Machine Model, referred to as SVMM) in AI-ESTATE, this system completes the function test and fault diagnosis by calling the various models, and through the fault tree model of IEEE1232proposed by matching, fusion SVM algorithm, design and Realization of automatic generation of analog circuit fault tree, the ability to import PCB model and error display device in fault diagnosis, finally by calling Word to automatically generate Word document to realize the automatic report generation function. The test shows that, this system can replace the decision tree method in the past by artificial knowledge manual testing, can improve the testing efficiency, has the advantages of simple operation, test success rate compared with improved and testing program than the original stability.
Keywords/Search Tags:Analog circuits fault diagnose, Fault Tree Module, IEEE1232
PDF Full Text Request
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