Realization Of Automatic Test Platform Of Rf Chip At High And Low Temperatures

With the rapid development of electronic chip industry, chip quality directly affects the performance of the product. Thus research on automated test of chip has been very necessary. NRF24L01 is a common chip whose frequency is at 2.45 GHz and which is capable of wireless transceiver. This paper presents an automated testing platform for NRF24L01 chip.This paper firstly describes the meaning of the test platform and the arrangement structure of the paper. Then describes the instruments which provide external temperature environment for chip- high and low temperature, and operating modes of NRF24L01 RF chip including the emission pattern this paper uses the test platform to control. The overall design framework of automated test platform is given.Then the paper describes the concept of virtual instruments, virtual instrument architecture, control instructions and bus technology, and achieves control of the spectrum analyzer in the measurement system based on the principles. The first is the host computer interface and designes an interface based on the application of database access technology and VISA function. The interface enables initialization spectrum analyzer, automatic test platform and automated management of test data. Then is to achieve lower computer platform. Through serial communication, the paper achieves settings on NRF24L01 RF chip operating modes by test platform based on STM32F103 chip and completes PC control on the radio frequency chip. The platform realizes the conventional functions of test system: such as control of the test platform, automated data storage, spectrum analyzer control and waveform display.Finally, the paper does practical applications of automated test platform. This paper analyzes the influence of temperature on the output power and provide reference for users. The test results show that this platform has friendly interface and is easy to operate. The success of the test platform design greatly reduces the chip testing cycle, improves the test efficiency and has a good reliability.