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Research And Implementation Of CCD Amplifier Test Methods

Posted on:2016-06-26Degree:MasterType:Thesis
Country:ChinaCandidate:Z Q YueFull Text:PDF
GTID:2308330482479973Subject:Integrated circuit engineering
Abstract/Summary:PDF Full Text Request
CCD,the abbreviation of both“Charge-coupled Device”and the chinese words“电荷耦合器件”,is a kind of semiconductor which can complete the translation from optical image to digital signal.CCD has a wide application in many fields such as astronomy,digital photography,which is specially apt to optical&frequency spectrum telescope,optical telemetering technology and high-speed photography.It is worth mentioning that CCD’s predominant characters lie in low-power dissipation,small in size,light weight,long service life,low noise,stability in performance,resistence to shock and vibration,high sensitivity,low operation voltage,big dynamic range,high-speed in response,etc.CCD,acting as the critical component of modern National Defense Equipment,is widely used for GPS,resource location,missile homming,satellite reconnaissance,night-vision,astronomical observation and so on.Thus,it plays the important role in motivations of the equipment development and promotion of the equipment performance.In brief,the quality of CCD determines the property of the equipment system.The problems occurring during the process of CCD could gravely lead to low quality and invalidation of CCD. The common invalid pattern consists of low saturation voltage of output, inefficiency of transformation, and decrease in dark current, etc. To avoid producing the inferior CCD, we could adopt simple but practical test method, in the beginning, to precisely measure the input&output curve and gain curve of the amplifier, and acquires massive information like CCD’s DC output voltage, gain maximum, linear work rerion, which is of vail in promotion of CCD’s quality.This paper addresses the shortcomings of existing problems mentioned above,systematically introduce a new test method, taking the high-performance CCD source-follower amplifier as the research objects, on the basis of analysis in current fabrication technologies and the working principles of CCD. The new method is innovatively designed for testing CCD source-follower amplifier referring to the thoughts of other similar kinds of amplifiers and testing method, which succeeds in accurate testing measurement of input&output curve, gain curve of the amplifier, linearwork region and other arguments.
Keywords/Search Tags:source-follower amplifier, DC output voltage, gain, linear working region
PDF Full Text Request
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