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Preparation And Characterization Of Titanium Dioxide Films On MgAl2O4 And LaAlO3 Substrates

Posted on:2018-10-27Degree:MasterType:Thesis
Country:ChinaCandidate:H S XuFull Text:PDF
GTID:2311330512485231Subject:Microelectronics and Solid State Electronics
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Transparent electronics and transparent oxide optoelectronics have caused widespread attention and rapid development since they came into notice,which makes the wide bandgap oxide semiconductor materials more and more popular.As an wide bandgap oxide semiconductor material,TiO2 has many good properties such as a high dielectric constant,a large refractive index,a high photochemical activity and stable physicochemical properties,and therefore is widely used in many fields such as flat panel displays,photocatalysis,transparent conducting oxides?TCOs?,field effect transistors?FETs?,solar cells and gas sensors.In this paper,anatase TiO2 thin films were grown on MgAl2O4 and LaAlO3 substrates by MOCVD.High pure Ti?N?CH3?2?4,N2 and O2 were used as titanium organic source,carrier gas and oxidant in the experiment,respectively.TiO2 films were prepared successfully on the above substrates at the organic source molar flow rate of 4.03 10-7 mol/min.The substrate temperatures were 500?.550?.600? and 650?,respectively.The key research work and results are as following:1.Preparation and characterization of TiO2 thin films on MgAl2O4?100?substrates:The structural analyses indicated that the TiO2 film prepared at 600? had the best single crystalline quality with no twins.The out-of-plane and in-plane epitaxial relationships of the film were a-TiO2?001??MgAl2O4?100?and TiO2[100]?MgAl2O4[100],respectively.A uniform and compact surface with stoichiometric composition was also obtained for the 600?-deposited sample.The average transmittance of all the TiO2 films in the visible range exceeded 91%and the optical band gap of the films varied from 3.31 to 3.41 eV.2.Preparation and characterization of TiO2 thin films on MgAl2O4?111?substrates:The structural analyses showed that the films were highly?004?oriented with tetragonal anatase structure and the epitaxial relationship was given as a-TiO2?004??MgAl2O4?111?.The sample prepared at 600? exhibited the best crystallization with a single-crystalline epitaxial film.The average transmittance of every TiO2 film in the visible range exceeded 90%excluding the influence of the substrate.The morphology and composition of the TiO2 films have also been studied in detail.3?Preparation and characterization of TiO2 thin films on LaAlO3?001?substrates:The structural studies revealed that the TiO2 film prepared at 600? had the best single crystalline quality with no twins.The out-of-plane and in-plane epitaxial relationship of the films were a-TiO2?004??LaAlO3?001?and TiO2[100]?LaAlO3[100],respectively.The optical band gap of the films ranged from 3.30 to 3.37 eV.The morphology and composition of the TiO2 films have also been studied in detail.
Keywords/Search Tags:TiO2, MOCVD, MgAl2O4, LaAlO3, anatase
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