Design Of Ceramic Substrates Surface Examining And Sorting System

In the composition material of the resistors and capacitors, the size and surface smoothness of the ceramic substrate determines both value of the resistor and capacitor capacity. At the same time, with the electronic information industry development, the resistors and capacitors are made more and more smaller. Which have high demands on the quality of the manufacturing process used in the support materials. Currently on the market when the detection of the ceramic substrate in order to overcome the artificial defects detected using visual processing, but most of the methods that have made large computational systems, and hardware needed the precise fit to complete the image acquisition.On this basis, present study mainly designed ceramic substrates detector which is used to detect smoothness of surface of the ceramic substrate and dimension of the ceramic substrate,and to detect verticality of the rectangular ceramic substrate. The system design a sorting mechanism for binding to the test results of the product for automatic sorting. The specific work as follows:(1) Analysis of the common substrate defects and size, According to defect feature parameters of the substrate if it contains the defect to do judgment, classification, and complete performance of detection tasks. The system uses a good stability and high transmission efficiency PPI protocol communication to transfer test results that embedded system obtarned to PLC. And through the servo motor control to complete the automatic sorting function. At last, the use of miniGUI is created for human-machine interface, complete the interactive features of the process.(2) In the substrate detection process, in order to overcome the shortcomings of traditional parameters calculation error occurred during position coordinates of the image edge points is calculated, firstly use pixel coordinates calculated the result of a calculation; then find the center of gravity of the substrate, and the farthest point and the center of gravity away from the nearest point to the relevant parameters, obtained of another calculation results; Finally, both for analysis comparison, the final calculation parameters. This paper designed parameter calculation program.(3) System uses real-time image acquisition, image processing program which was developed on the embedded platform to obtain the edge image of one pixel wide. And the system uses sub-pixel algorithm to obtain the subpixel edge coordinates which was used to calculate the parameters.(4) Under existing laboratory experimental conditions, experimental platform was set up for each control part of the system were carried out experiments. Through experimental results, the various parts of the system can be completed under the guidance of the relevant procedures corresponding system functions, and verify the system design ceramic substrate can be completed within the time prescribed error range and the testing and sorting functions, low power consumption, low cost, easy installation, high precision, good real-time characteristics, and can overcome the many shortcomings of traditional detection.