Research On The Ferromagnetic Resonance Linewidth Measurement Of Ferroelectric Thin Film Materials

Ferroelectric thin film materials are widely used to make microwave devices.Ferromagnetic resonance linewidth is a parameter to measure the microwave loss of magnetic materials,the manufacturer of Ferroelectric thin film materials is usually used the resonant cavity perturbation method to measure the linewidth of the magnetic materials.Due to the need for miniaturization and lightweight of various devices,therefore,ferroelectric materials need to be improved in the direction of miniaturization,film and integration.At the same time,the manufacturers and users of ferroelectric thin film materials have put forward new requirements for the test of ferromagnetic resonance linewidth,for example,improve the test accuracy and the test range.How to meet the growing demand of manufacturers and users has become a new topic in the field of ferromagnetic resonance linewidth testing.The purpose of this paper is to set up a test scheme to realize the measurement of the ferromagnetic resonance linewidth about ferroelectric thin film materials in the 8~18GHz band,and design the microwave devices,at last,build a test system.The main tasks of this topic include the following aspects.Firstly,introduce the research trends of ferromagnetic resonance linewidth measurement technology,and summarize several common methods of measuring linewidth,then determine the test scheme in this paper;According to the test index,choose the double-ridge waveguide fixture as the test fixture,and design the waveguide coaxial transition joint,for the samples need be placed in the strongest microwave field and the weakest electric field,the double ridge waveguide is more concentrated than the rectangular waveguide with the same size;In order to make the experiment more convenient,this paper has designed the software for Gauss meter and DC power;Finally,built the test system and mesurement the ferromagnetic resonance linewidth of samples.The test results and analysis show that the test system built in this paper can meet the test and the index needs.