Automatic Optical Inspection System Of Thick Film Integrated Circuits

As the industry 4.0 concept has been raised up widely, the trend of new industrialization has been paid due attention by the many countries, who have taken various actions for it. Among several main industry segments which all those actions focused on, inspection system is one of the most significant, which is also struggling with relatively low development level. So far, most of the industry inspection rely on manual operation, and it is doubtful that it has meet the requirement of industry 3.0, let along the digitization of the whole manufacturing process and the integrated modular based on Information and Communication Technology in the industry 4.0.To contribute to the development of industry inspection, this paper takes the inspection of thick film integrated circuits, a classic inspection matter as the research object. After compared some typical implementations of Automatic Inspection System for circuit board from domestic and foreign patents and relative literatures, Optical Inspection is chosen as the research direction due to its characteristics of real-time, expandable and convenient industrial transformation.On the basis of optical inspection and absorbing the essence of existing inspection systems and algorithms, this paper firstly proposes and uses a special Optical Inspection Algorithm For Thick film Integrated Circuits(converting Gerber file to reference map and combined with Real Standard Circuit Board Image), by which the circuit layers and circuit modules are detected respectively. The global light control problem troubling the existing inspection system has been well circumvented by this algorithm by means of regional inspection. In this research, the method of separate detection to the circuit module location and colors that provided by detection template has solved the existing problems that unable to detect out System circuit module dislocation, Color incorrect, leaking print. Although this system has just realized automation in core inspection module and still needs to be advanced, but it has operated smoothly when tested at the Thick film Integrated Circuits Inspection Shop of Shenzhen Zhenhua Microelectronics Co.This paper is started with introduction of application background of the Automatic Inspection System of Thick film Integrated Circuits, and then followed by description and realization of the theories of all the algorithms associated with requirements in this system. Then, the software and hardware of this system has been introduced in detail, last but not least, the reliability, real-time performance, advancement of this inspection system has been verified via analyzing the detection results.