Test And Study Of Single-channel Electron Multiplier

The single-channel electron multiplier(CEM)is a new type of detector for amplifying weak signals.It has high gain,low noise,and provides strong technical support for use in various sophisticated analytical spectrometers.Because the parameters of CEM directly affect its performance,this paper proposes a method to detect very weak ion currents.The performance parameters of single-channel electron multipliers can be detected by the experimental device that tests the ion current under vacuum.In this experiment,the CEM was used to detect the ion currents,and the theoretical analysis of the output signals was carried out to design the corresponding preamplifier.The noise was analyzed for each amplifier and the corresponding noise elimination theory was proposed.The method detects the ion current,analyzes the experimental results,and improves the maximum voltage,analog gain characteristics,power supply,and different connection methods of the shield of the follow-up CEM test,and analyzes the counting mode and related test analysis.optimization,the characteristics of CEM and related test systems designed relatively reasonable testing programs,as well,to complete the test studies of single channel electron multiplier.