Study On The Absorption And Infrared Emissivity Of Composite Microstructured-films

As an indispensable part of the optical systems,micro-structured films have a wide range of utilization,in aerospace and even popular in our daily life.Basing on the preparation technologies of the microstructured-films,the present study was mainly focused on the researches of infrared antireflection coatings and metal/dielectric films,including the optimization methods of film system designing and the designing of the correlated films and the tests of their characteristics.The research results mainly included:1.The preparation technology of micro-structured films was introduced,having tested and analyzed the properties of the vacuum evaporation technology equipment used in this study;the film thickness control technology in the vacuum evaporation process was also specifically analyzed from working principle to practical application;the performance of various characterization techniques for microstructured films were also been evaluated,including spectrophotometers for spectral performance characterization,emissivity measurement devices for infrared emission emissivity studies,and electron microscope for field emission scanning for microstructure characterization of microstructured films.2.Basing on TFCalc film design software and its automatic optimization design,we designed and completed a kind of near-infrared anti-reflection coating.Through the powerful calculation function of the thin film design software and according to the work requirements,we considerably optimized the design parameters and the film system was also automatically optimized.Finally,the theoretical simulation data and the actual measurement data of the optical properties of the film after optimized design were compared and analyzed.The results showed that the membrane system with automatic optimization design had a stable broadband infrared antireflection performance.3.A low-reflectivity infrared anti-reflection coating was designed in the mid-infrared region by admittance diagram method and transmission matrix method(TMM).Besides,we also conducted the theoretical calculations simulations and experimental preparation on the transmittance,reflectance,absorption,and emissivity of the designed film system.Through comparison and analysis of the test results,it could be concluded that the plated double-sided infrared anti-reflection film silicon wafers we designed in this experiment had high-efficiency and stable anti-reflection properties in the mid-infrared waveband(5-9 ?m),and also had relatively low infrared spectral emissivity(~0.02),which would have good applications in the low emissivity window in infrared systems.4.Through the preparation and characterization of several metal/dielectric structural film systems,the transmission,reflectance,and absorptivity performances were tested and analyzed.Then,a micro-structured thin film that was insensitive to angle was also designed and fabricated according to the special photoelectric characteristics of the metal/dielectric structure.By testing the spectral characteristics of the prepared film,the results showed that the prepared metal/dielectric film sample had a rather good full-angle passing band under P-polarized light.