Research On The Anti-Radiation Characteristics Testing Method Of Anti-fuse FPGA Devices

With our country paying more and more attention to space and national defense,Because of the features of low power consumption,high reliability and high confidentiality,anti-fuse FPGA has been widely used in aerospace electronic systems.However,due to the effects of cosmic rays and electromagnetic interference,FPGA applied in aerospace is prone to failure due to particle radiation.In order to ensure the high reliability and certain service life of the anti-fuse FPGA device,people need to conduct radiation test on the chip to verify the antiradiation performance of the device.However,due to the limitations of domestic irradiation test equipment and other conditions,the current research on the integrated circuit irradiation test method is still in the initial stage,lacking sufficient test experience,and there is no test standard that can be relied upon.Most of the irradiation tests of integrated circuits are carried out according to the requirements of users.Most of the irradiation test systems used in the tests are not efficient in test efficiency,and the test parameters are not comprehensive enough,and the data accuracy is low.Even after the first irradiation test,the irradiation test system is not capable of conducting a second test,so it has no good reference.Therefore,it has great significance to explore high-precision,high-efficiency,low-cost anti-fuse FPGA antiirradiation test methods.Firstly,The paper analyzes the mechanism of the radiation effect of space environment.Paper studied the cause and possible effects of the single-particle effect,the total dose ionizing radiation effect and the transient dose rate irradiation effect.Based on this,the antifuse-based FPGA was mainly used to analyze the difference in function and performance index of the different types FPGA circuitwhen subjected to ionizing radiation.It provides a certain theoretical support for exploring the anti-fuse test method of anti-fuse FPGA.Based on the application of anti-fuse FPGA in weapon equipment system,this paper proposes an anti-fuse FPGA device test method under two kinds of irradiation conditions: steady-state total dose and instantaneous dose rate.According to the performance index requirements of the anti-fuse FPGA in practical applications and the test environment conditions of the steady-state total dose and the instantaneous dose rate,the design structure of the anti-irradiation performance test system is established,and the hardware and software development are carried out on this basis.The design of PCB circuit board based on the antiradiation test system was completed,and the control code of the slave computer was completed by using assembly language.The C++ language realized the design of the test software of the host computer.In view of the problems encountered in the development stage of the system,such as the transmission and measurement of long-distance signals,the problem of long-distance power supply voltage compensation,and the processing of transient radiation and large current,this paper also proposes corresponding solutions.It is described in the chapter of the design and implementation of the anti-fuse FPGA antiradiation performance test system.In the test system verification stage,150 Gy steady-state total dose test and instantaneous dose rate test of 2.4e9gy(Si)/s,4.3e9gy(Si)/s and 4.2e9gy(Si)/s were carried out based on domestic lc1020b-rha anti-fuse FPGA in China engineering physics research institute and northwest nuclear technology research institute,respectively,to test the function and reliability of the test system.It is used to verify the function and reliability of the test system.After the test is completed,the data is analyzed to verify the variation of the current with the irradiation dose when the anti-fuse FPGA device is subjected to ionizing radiation.The experimental results show that the system can test the antifuse-based FPGA device under two irradiation environments: instantaneous dose rate irradiation test and steady-state anti-γ total dose irradiation test.It solves the problem that it is difficult to perform real-time monitoring and full-parameter test of multiple parameters of different types of anti-fuse FPGA circuits in the long-distance test process under irradiation test environment.The system has high test accuracy and anti-ionization interference capability under the longdistance signal transmission frequency.It can provide an efficient and reliable verification method for the anti-fuse FPGA device in the total dose test and the instantaneous dose rate test.The test system completed in the paper meets the design requirements.