Design And Implementation Of Automatic Test System For Chips Based On SOPC Technology

Since the 1960s,IC products have gradually entered millions of households and integrated into everyone's lives.They have played a decisive role in all walks of life.Nowadays IC design and manufacturing have reached an unprecedented height,and the packaging and testing industry has experienced the difficulty of chip testing.According to statistics,the proportion of test links in the integrated circuit industry is increasing day by day,requiring a longer test cycle,and the accuracy rate is also difficult to meet.Therefore,the transition to automated testing must be the only way for chip testing.In view of the above problems,the main work of this paper is to design an automatic test system for MEMS(Micro Electro Mechanical System)digital detector control chip.This system accomplishes the implementation of lower computer system and PC-side host computer software through SOPC technology.The main work is divided into three parts:1)NIOSII embedded soft core is used as the processor in the lower computer system.Based on the Avalon bus,the IIC interface control module and data acquisition function module core designs are performed to complete the target chip mode conversion control and output data collection functions.Chip PL2303 and host computer software for information transmission.2)Based on Visual Studio 2015 tool development software design for the lower computer,the lower computer software has all editable operating instructions in the automated test editing and sending window and data graphical display window,testers need only a simple operation in the test process Can finish the control and data acquisition function of the digital chip in the test process.3)Set up a traditional mode test platform and use the test system designed in this paper to perform a full functional test of the test chip,and finally analyze the results.By using the test system designed in this paper and the traditional test methods,the results show that the test system designed in this paper not only can quickly complete the test work of the chip,but also reduces the dependence on external test instruments.In addition,it has the characteristics of simple operation,saving time,low cost,and high accuracy.