High Performance FPGA Test Method Based On ATE

Field Programmable Gate Array(FPGA)has become the mainstream chip of electronic system design due to its small size,low energy consumption,high performance and repeatable programming.With the increasing complexity and integration of chips,the requirement of reliability test and selection of electronic components is more and more high,the test demand of FPGA becomes particularly urgent.Therefore,on the basis of ensuring the test coverage,reducing the number of configuration,reducing the test cost,and providing a set of full FPGA test methods and test process has important application value.This article studies the testing method of Xilinx FPGA,the main content is divided into the following three aspects.Based on the analysis of the function and structure of FPGA,this article designs the test method of Configurable Logic Block(CLB)with the idea of one-dimensional array method.Improves the Look Up Table(LUT)resource test method,designs physical constraint file by region partition,which can effectively reduce the time of writing constraint file,accurately locate the fault and improve the fault detection rate.The I / O Block(IOB)is designed by setting two-way port.The configuration of test graph can realize the test of bidirectional transmission function of IOB port.Programmable Interconnect Resource(IR)is tested by deterministic routing method.Through configuration graphics design and simulation,the function test of each module resource is carried out,and the feasibility of the test method is verified.In this article,a universal matrix loadboard named HSCV256＿Eueo Pin＿V3 is designed by adding matrix switching circuit to solve the problem of multi power supply test and diversity of chip pin definition.Which provide peripheral hardware support for chip testing.Based on the research of test methods and the design of loadboard,this article takes BC3192 EX as the ATE test platform.Configure functions,write test programs,completed the function and parameter test and verify FPGA test methods throughexperiments.This article provides a practical solution to the problem of FPGA testing,which can be used as the template of FPGA testing and provides a complete set of full FPGA test method and test process.