Modeling and control of atomic force microscope for imaging using high order harmonic modes |
Posted on:2008-06-05 | Degree:M.S | Type:Thesis |
University:Michigan State University | Candidate:Nyenke, Chinwe Pamela | Full Text:PDF |
GTID:2442390005478960 | Subject:Engineering |
Abstract/Summary: | |
This research assesses the imaging of specimen surface features using higher flexural modes associated with the oscillation of the atomic force microscope (AFM) cantilever. A computer simulation based on the Euler-Bernoulli Beam Equation is designed to measure variations in the oscillation amplitude due to variations in the specimen surface. The results are then compared to those of an experiment employing a real AFM and lock-in amplifier. Both simulation and experimental results demonstrate that examining higher modes yields more accurate information about a specimen surface property---particularly elasticity and topography---which is consistent with previous studies. More importantly, this research achieves improved sensitivity to surface information in lower modes when exciting the cantilever at a higher resonance frequency. The latter finding eliminates the need to extract and enhance the amplitude of higher modes, which are magnitudes smaller and consequently more difficult to measure and analyze. |
Keywords/Search Tags: | Modes, Higher, Specimen surface |
|
Related items |