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High-resolution structural studies of ultra-thin magnetic, transition metal overlayers and two-dimensional transition metal oxides using synchrotron radiation

Posted on:1998-03-12Degree:Ph.DType:Thesis
University:University of California, BerkeleyCandidate:Kellar, Scot ArthurFull Text:PDF
GTID:2461390014474714Subject:Chemistry
Abstract/Summary:
This thesis reports the surface-structure determination of three, ultra-thin magnetic transition-metal films, Fe/Au(100), Mn/Ni(100), and Mn/Cu(100) using Angle-Resolved Photoemission Extended Fine Structure (ARPEFS) and photoelectron holography. These structural studies are the first to use non-s initial states in the ARPEFS procedure. This thesis also reports an ARPEFS surface-structure determination of a two-dimensional transition-metal oxide, ((1x1)O/W(110)) x12.; We have analyzed the ARPFES signal from the Au 4f{dollar}sb{lcub}7/5{rcub}{dollar} core level of the Au(1 ML)/Fe(15 ML)/Au(100) system. Our analysis shows that the Fe grows layer by layer with one monolayer of gold, acting as a surfactant, remaining on top of the growing Fe layers. These surface gold atoms sit in the four-fold hollow site, {dollar}1.67pm0.02{dollar} AA above the iron surface. The grown Fe layer is very much like the bulk, bcc iron, with an interlayer spacing of {dollar}1.43pm0.03{dollar} A.; Analysis of the Mn 3p ARPEFS signals from c(2x2)Mn/Ni(100) and c(2x2)Mn/Cu(100) shows that the Mn forms highly corrugated surface alloys. The corrugation of the Mn/Ni(100) and Mn/Cu(100) systems are 0.24 {dollar}pm{dollar} 0.02 Bi and 0.30 {dollar}pm{dollar} 0.04 A respectively. In both cases the Mn is sticking above the plane of the surface substrate atoms. For the Mn/Ni(100) system the first layer Ni is contracted 4% from the bulk value. The Mn/Cu(100) system shows bulk spacing for the substrate Cu. Photoelectron holography shows that the Mn/Ni interface is very abrupt with very little Mn leaking into the second layer, while the Mn/Cu(100) case has a significant amount of Mn leaking into the second layer.; A new, five-element electrostatic electron lens was developed for hemispherical electron-energy analyzers. This lens system can be operated at constant transverse or constants angular magnification, and has been optimized for use with the very small photon-spot sizes. Improvements to the hemispherical electron-energy analyzer are also discussed.
Keywords/Search Tags:Layer, Mn/ni, Mn/cu, ARPEFS, Surface
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