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Near-field Optical Identification Of Metallic And Semiconducting Single-walled Carbon Nanotubes

Posted on:2021-01-07Degree:MasterType:Thesis
Country:ChinaCandidate:L L WangFull Text:PDF
GTID:2481306503965499Subject:Physics
Abstract/Summary:PDF Full Text Request
Due to their outstanding electrical and optical properties,single-walled carbon nanotubes are expected to have extensive applications,such as in transparent conductive films and nanoscale integration of photonic and electronic devices.However,those applications can only be best realized with pure metallic or pure semiconducting carbon nanotubes.Hence,identifying and separating metallic from semiconducting carbon nanotubes in as-grown samples are crucial.Besides,knowledge of the type of a carbon nanotube is also important for further exploring its new properties in fundamental science.Here,we report employing scanning near-field optical microscopy as a direct and simple method to identify metallic and semiconducting carbon nanotubes on Si O2/Si substrate.Metallic and semiconducting carbon nanotubes show distinct near-field optical responses because the metallic tubes support surface plasmons,whereas the semiconducting tubes do not.The reliability of this method was verified by using field-effect transistor testing and Rayleigh scattering spectroscopy.Our result demonstrates that the scanning near-field optical microscopy technique provides a reliable,simple,noninvasive and in situ method to distinguish metallic and semiconducting carbon nanotubes.
Keywords/Search Tags:Carbon nanotube, Metallic/Semiconducting, Identify, Scanning near-field optical microscopy(SNOM), Surface plasmon
PDF Full Text Request
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