Study On The Influence Of Different Apertures Of An Electrical Connector On Contact Reliability

Electrical connector is an electronic component used for conducting signal,which plays a very important role in equipment system.Statistics data shows that the proportion of failures caused by electrical connectors in the system is up to20% to 30%,and the reliability of electrical connectors directly affects the reliability of the system.According to the different size and form of contact pairs,electrical connectors can be divided into single-aperture electrical connectors and multi-aperture electrical connectors.Multi-aperture electrical connectors have contact pairs of multiple sizes and specifications.Contact pairs with different apertures have different performance degradation rates.However,the current reliability research on the multi-aperture electrical connector basically ignores the influence of its contact pairs on the aperture difference,which will inevitably bring errors to the evaluation results.Based on this,this dissertation takes a certain type of multi-aperture electrical connector as the research object,carries out the research on the influence of the difference of the contact pairs aperture on the contact reliability,and proposes the contact life evaluation method of the multi-aperture electrical connector.The specific research work is mainly from the following aspects:In chapter 1,the background and significance of the research in this article are introduced,and the research status from three aspects: product reliability modeling,product reliability statistical analysis,and contact reliability research of electrical connectors are analyzed.The current problems in the reliability evaluation of multi-aperture electrical connectors are summarized,and the research objectives and content of this article are put forward.In chapter 2,the environmental benefit analysis is carried out according to the structure,material and function of the electrical connector,combined with the environmental stress faced in the storage profile of the electrical connector,and the key stress affecting the contact reliability of the electrical connector is determined as temperature.In-depth analysis of the influence of temperature and dimensional parameters of contact pairs on the contact performance of electrical connectors,the internal reasons for the deterioration of electrical connector contact performance from the mechanism level are revealed.In chapter 3,researched and constructed the mathematical relationship between the dimensional parameters of the contact pair and the contact force through the slotted closed jack reed cantilever beam model based on the electrical contact failure mechanism of the electrical connector,thereby establishing the fusion pin Contact resistance degradation trajectory model of contact pair size parameters such as diameter,reed slot width,length,inner fillet radius,inner and outer surface curvature radius,contact pair failure distribution model,and acceleration model.And according to the definition of degenerate failure,the contact pair degeneration failure distribution model is derived.According to the relationship between the electrical connector and the contact pairs of different apertures,the reliability evaluation model of the multi-aperture electrical connector is established.In chapter 4,a three-dimensional model of a certain type of multi-aperture electrical connector is constructed based on the Solid Works platform.The thermal simulation analysis of the multi-aperture electrical connector is performed using the ANSYS Workbench platform to simulate the heating environment of the actual test process and apply the temperature load calculates the time required for the electrical connector to reach thermal equilibrium during the test,and estimates the effective heat soak time of the contact pairs of different apertures of the electrical connector,which provides a basis for the preliminary processing of subsequent test data.Based on the failure mechanism of the electrical connector,combined with the results of thermal simulation analysis,an accelerated test plan was developed and the test is carried out.In chapter 5,based on the collected test data form of each contact pair of the multi-aperture electrical connector,the joint degradation and life estimation method are used to evaluate the reliability characteristic value of the contact pair of different apertures and the contact reliability level of the electrical connector.Using the F test and the Bartlett test,the conclusion that the contact pairs of different apertures cannot be regarded as the same population is verified,and the accelerated degradation model of the built multi-aperture electrical connector is statistically tested by combining the probability graph method and the numerical analysis method.Using scanning electron microscope and energy spectrometer to conduct failure analysis of electrical connector contact pairs,verifying the correctness of the theoretical analysis of failure mechanism.In chapter 6,the research contents and achievements of this paper are summarized,and the imperfections of this research and the key directions of future research are put forward.