Research And Design Of Anti-shock Data Acquisition And Storage Device

Obtaining the parameters in the development and test process plays an important role in the optimal design and functional performance evaluation of ammunition.According to the test record requirements of a certain type of ammunition test,an anti-impact data acquisition and storage device is designed,which can acquire and store 10-channel fuze control signals and triaxial acceleration sensor signals when the projectile penetrates.By analyzing the time sequence and parameters of the data recorded by the device after the test,we can accurately evaluate the external ballistic function time sequence of multiple functional components on the missile and the penetration performance in the process of hitting the target.According to the index requirements and design principles of the data acquisition and storage device,this paper introduces the module composition and functions of the device,and optimizes the protection structure to meet the needs of high impact test environment.This paper introduces the hardware design principle of the device in detail,and realizes the low power consumption control of the whole system,as well as the signal conditioning and acquisition of fuze and triaxial acceleration sensor.The software flow of the system and the logic design of the acquisition and storage module are described.The acquisition device is set in different working modes to meet the acquisition requirements in different states.The FPGA controls the multiplexer channel switching sequence and ADC channel switching sequence to realize the acquisition of different signals at different sampling rates.The data acquisition and storage logic adopts FIFO+ dual-port RAM cache structure,caches the converted digital data,frames it and stores it in FLASH.A parallel CRC data check algorithm is used to ensure the accuracy of data transmission.Aiming at the environmental adaptability of the data acquisition and storage device,this paper introduces the environmental screening tests such as high and low temperature test,impact test and random vibration test.The gun test proves that the impact resistance and data acquisition performance of the data acquisition and storage device have reached the expected design index.