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Research On Test And Application Technology Of IGBT Three Phase Drive Chip

Posted on:2019-04-16Degree:MasterType:Thesis
Country:ChinaCandidate:K H RenFull Text:PDF
GTID:2518305702953349Subject:Master of Engineering
Abstract/Summary:PDF Full Text Request
Intelligent power integrated circuits are widely used,including many fields such as motor drive,electronic lighting,industrial control,power management,and display drivers.As an important part of intelligent power integrated circuits,motor drive chips have always been the focus of research at home and abroad.In the motor drive system,the high-voltage power driver chip plays an important role as a motor drive chip,which controls and protects the power switch tube as a "muscle" of the power switch tube.How to improve the performance of the driver chip and reduce the power consumption of the motor driver chip in order to maximize the ability to use the motor is the development trend of the motor driver chip design,but compared to the improvement of the drive chip structure,its test work is often overlooked Actually,accurate and efficient testing and evaluation of its function parameters and reliability levels prior to shipment from the factory is the key to ensuring that the factory’s high-voltage power driver ICs are complete in function,meet standard parameters,and have high reliability.At the same time,the problems in the chip structure or manufacturing process can be found earlier.So the following work is carried out in this paper:(1)Analyzed and studied the structure of the IGBT three-phase drive chip,and selected the suitable test parameters.Based on the ASL1000 automation test system,the software and hardware test environment is developed,and the batch automation test of the sample is completed,the test data is accurate and the test environment is stable and reliable.Meanwhile,on the premise of meeting the test requirements,the test time for a single chip is only 1.2 seconds,much less than the predetermined upper limit value 1.8s,which saves the cost of testing.(2)The following work has been done to evaluate the reliability of the sample and the technology used: ESD and LATCH UP tests for samples that conform to the JEDEC standard.A complete process monitoring graphics which is in line with the GJB7400 standard is designed.The design process monitoring chart has no influence on the main power drive chip based on the complete evaluation of the reliability of the selected process.According to the wafer test,the corresponding original data can be used to evaluate the reliability of the process.(3)The structure and driving mode of the widely used DC brushless motor(BLDC)are analyzed and studied,the simple motor MCU control module is realized by CPLD design.In addition,the motor control system is formed with IGBT three-phase drive chip and IGBT,and the stable and controllable rotation of the BLDC motor is realized.
Keywords/Search Tags:motor drive chip, automatic test equipment, process monitor, brushless DC
PDF Full Text Request
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