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Atomic Force Microscopy And Application In Molecular Structure Of IPC-208B Typed AFM

Posted on:2007-04-05Degree:MasterType:Thesis
Country:ChinaCandidate:H H BaiFull Text:PDF
GTID:2120360185974981Subject:Theoretical Physics
Abstract/Summary:PDF Full Text Request
Atomic Force microscope (AFM),which was developed 1986 and has gone through many improvements in technology and wide applications ,establishes its status as a kind of surface analyzed apparatus depending on nanometer-level resolution and unlimited conduction of samples. It has made seven aspects obtain rapid development in nanometer technology field, especially in biology, life science and material science, plentiful scientific research fruits has been obtained, which widened huge developmental space for those former bottle-neck specialty.The paper firstly introduces the development of Atomic Force Microscopy, and the foundational principles of AFM, then states the whole system of AFM.IPC-208B developed by Chongqing University, its sensitive feedback circuit and nanometer-level driving system ensure the stability of the whole work state; the more important task in the paper is the discussion of the effect factors to tested precision in the course of experiments, and the application in nanometer material field, especial the observation and study on small molecular structure. In the paper some obtained outcomes are been stated and discussed in details.In the end of the paper, the difficulty in the experiments is been pointed to ,and explained from the theory, at the same time, some improved suggestions are also put forward ,as the reference for further work.
Keywords/Search Tags:Atomic Force Microscope (AFM), Scanning Tunneling Microscope (STM), Wiry cantilever, Feedback system, Nano-material, Micro-structure
PDF Full Text Request
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