Preparation And Characterization Of FM/AFM Nano-mulitlays And Research Of Magnetic Property Of Multilayers

After the system of ferromagnetic and antiferromagnetic multilayer are cooled from the temperature which is higher than the Nell temperature of anti-ferromagnetic, the loops of anti-ferromagnetic will deviate from the origin on the direction of magnetic field. The magnitude of deviation called Exchange Bias(HEX). Since it was first discovered by Meikleijohn and Bean in 1956 from Co of covered CoO system, it has attracted much attention. Many theoretical research and experiments on Exchange Basis of ferromagnetic and anti-ferromagnetic multiplayer has been carried out. It was found that the fundamental properties can be affected by a lot of parameters.In the present study, FM/AFM nano-multilayers were prepared by magnetron sputtering method. The influences of different heat treatment on Exchange Bias were studied by controlling system parameters.The structure, topography and magnetization of the multilayers were characterized by XRR spectroscopy, XRD spectroscopy, SEM and VSM. The mainly results are as follows:(1) Anneal process is favored to the growth of crystal grain, therefore, it reduce inner stress, but high anneal temperature may make the interface more rough.