Research On Modeling And Measurement Technique For Microwave Passive Devices

The density of the device on printed circuit board as well as the clock frequency uses in circuit is increased significantly, call for an accurate model of passive components to meet the requirement of signal integrity and product consistency. The Surface Mount Device (SMD) which is used in high frequency circuit is non-coaxial device, therefore, when a measurement is carried out by Vector Network Analyzer (VNA), the test fixture is necessary to connect Device under Test (DUT) and the VNA. Thus an error is brought in by the test fixture. To extract the device model parameter accurately, the de-embedding is a necessary procedure. Nowadays numerical method based on the Maxwell equations is used widely in the modeling problem of complex structure device.In this paper, the SMD resistor, inductor and capacitor are examples to introduce the measurement and equivalent circuit model extraction method. The concrete steps are:1) Coaxial test fixture used in measurement of SMD is designed. The test fixture is used to connect VNA and DUT, the measurement of open and short standard devices demonstrates the highest work frequency is up to18GHz. The equivalent circuit model of open and short standard devices is obtained.2) Two method is used in the network parameter measurement of SMD resistor, inductor and capacitor, they are the method based on test fixture and LCR meter (impedance analyzer), and the comparison of the results of the two methods is obtained.3) The SMD resistor. inductor and capacitor equivalent circuit model are obtained by ADS. The correction of equivalent circuit model and the extraction method is verified by the consistence of simulated result and measured result.