Atomic force microscopy - Globe Thesis

Keyword [Atomic force microscopy] Result: 181 - 200 \| Page: 10 of 10
181.	Study of polymer adhesion using atomic force microscopy
182.	Dendritic polymers as novel targeted anti-cancer therapeutics. Atomic force microscopy and molecular dynamics simulations
183.	Nanomechanical and electromechanical characterization on zinc oxide nanobelt using atomic force microscopy
184.	Characterizing Organic Photovoltaic Materials Using Atomic Force Microscopy and Transient Absorption Spectroscopy
185.	Surfactant adsorption during collisions of colloidal particles: A study with atomic force microscopy (AFM)
186.	Atomic force microscopy for sorption studies
187.	Interactions of grafted polymer brushes measured by atomic force microscopy
188.	Electrochemical and atomic force microscopy investigations of gold nanoparticles and metal oxide surfaces
189.	Study of the paper fibre surface using atomic force microscopy
190.	Sum frequency generation (SFG) surface vibrational spectroscopy and atomic force microscopy (AFM) studies of the composition, structure, and mechanical behavior of polymers at interfaces
191.	Preparation and characterization of spincoated polymer wedge films
192.	An in situ atomic force microscopy (AFM) investigation of tropoelastin-like peptide assembly at ordered interfaces
193.	Atomic force microscopy as a tool to investigate and use thin polymer films and chain interactions
194.	Surface-dependent structures and functions of fibrinogen studied by atomic force microscopy
195.	Biosensing based on self-assembled monolayers, atomic force microscopy and electrochemistry
196.	Atomic force microscopy studies of carbonaceous materials and their reactivity
197.	Systematic approach to electron lithography of self-assembled monolayers: Application to nano-autoradiography of biopolymers
198.	Investigation of microbiologically-induced corrosion of iron using electrochemical methods and atomic force microscopy
199.	Atomic force microscopy studies of polymeric, metallic, and biological surfaces
200.	Characterization of organic semiconductors via conducting probe atomic force microscopy
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