Transmission electron microscopy analysis of magnetization reversal processes in patterned Permalloy films, and dopant nanoclusters in the delta(3)-doped zinc selenide:telluride system

In the forefront of nanotechnology, transmission electron microscopy (TEM) is not only a powerful tool for examining matter at the nanoscale, but also associated with it is a wide range of techniques making quantification of physical phenomena and their associated dynamics possible in nanosystems. This dissertation covers TEM study of two separate areas that are both important to nanoscience and technology.; Continuous shrinkage in the dimensions of magnetic devices is quickly becoming a source of device instability. Understanding the processes that destabilize these small volume systems is crucial to the continuing progress in magnetoelectronic devices. Therefore, much of this work is dedicated to the in situ studies of magnetization reversal processes of patterned Permalloy films in TEM. Specifically, we focus on the various reversal mechanisms in Permalloy media by comparing experimental observations made via Lorentz microscopy with micromagnetics simulations. Detailed analysis of the reversal mechanisms are also given within the energy barrier framework.; Earlier work involves expanding on the progresses made towards the commercialization of the ZnSe system (a wide-band-gap semiconductor) for solid-state device applications. Enhancements in net acceptor concentration were obtained from delta 3-doped structures with tellurium and nitrogen as co-dopants. In particular, it was thought that spatially localized tellurium nanoclusters were the reasons for the observed enhancements. This work covers the micro-characterization in the delta3-doped ZnSe:(Te,N) system, specifically in the areas of cluster identification with micro-chemical analysis and other advanced TEM techniques.